Northrop Grumman Successfully Completes Qualification of a Radiation Hardened 1Mbit EEPROM Nonvolatile Memory
LINTHICUM, Md.,
Radiation hardened EEPROMs have long been used in space to hold critical mission data for decades without excessive shielding, rewrite circuits or climate controls.
Key features of the company's semiconductor device include latch-up immune operation in a space environment, greater than 10,000 endurance cycles, less than 250 nanosecond READ access time, 300 krad (Si) total ionizing dose and
Results indicate that memory retention at 125 degrees C will last for more than 200 years, which is well beyond the current state of the art for nonvolatile memory chips. The device was manufactured at
The device underwent dynamic life testing at 150 degrees C for 1,000 hours, as well as heavy ion latch-up and other testing.
Logo - http://photos.prnewswire.com/prnh/20121024/LA98563LOGO
To view the original version on PR Newswire, visit:http://www.prnewswire.com/news-releases/northrop-grumman-successfully-completes-qualification-of-a-radiation-hardened-1mbit-eeprom-nonvolatile-memory-300054370.html
SOURCE
Kelli Kraig, 410-765-3433, kelli.kraig@ngc.com